Enabling the Use of High-Precision Glass Wafers in a Conventional Si Fab.

Autor: Zhang, Jay1 (AUTHOR) zhangjj@corning.com, Ng, Chee-Hau2 (AUTHOR) chee_hau_ng@umc.com, Kouassi, Sebastien3 (AUTHOR) skouassi@psemi.com
Zdroj: IEEE Transactions on Semiconductor Manufacturing. Aug2023, Vol. 36 Issue 3, p340-344. 5p.
Databáze: Business Source Ultimate