Inverse model-based real-time control for temperature uniformity of RTCVD.

Autor: Theodoropoulou, Artemis, Zafiriou, Evanghelos
Zdroj: IEEE Transactions on Semiconductor Manufacturing. Feb99, Vol. 12 Issue 1, p87. 15p. 3 Black and White Photographs, 5 Diagrams, 17 Graphs.
Databáze: Business Source Ultimate