Measurement of Lateral Charge Diffusion in Thick, Fully Depleted, Back-Illuminated CCDs.
| Autor: | Karcher, Armin1, Bebek, Christopher J.1 cjebek@lbl.gov, Kolbe, William F.1, Maurath, Dominic2, Prasad, Valmiki1, Uslenghi, Michela3, Wagner, Martin2 |
|---|---|
| Zdroj: | IEEE Transactions on Nuclear Science. Oct2004 Part 1 of 4, Vol. 51 Issue 5, p2231-2237. 7p. |
| Databáze: | Business Source Ultimate |
| Externí odkaz: |
|