Metamorphic Testing: A Review of Challenges and Opportunities.

Autor: TSONG YUEH CHEN1 tychen@swin.edu.au, FEI-CHING KUO1, HUAI LIU2 Huai.Liu@vu.edu.au, PAK-LOK POON3 paklok.poon@rmit.edu.au, TOWEY, DAVE4 Dave.Towey@nottingham.edu.cn, TSE, T. H.5 thtse@cs.hku.hk, ZHI QU AN ZHOU6 zhiquan@uow.edu.au
Zdroj: ACM Computing Surveys. Jan2019, Vol. 51 Issue 1, p1-27. 27p.
Databáze: Business Source Ultimate