Analysis of the Effects of End Connection Quality on the Dielectric Loss of Metallized Film Capacitors.
| Autor: | Xiaoguang Qi1, Boggs, Steven2 |
|---|---|
| Zdroj: | IEEE Transactions on Dielectrics & Electrical Insulation. Dec2004, Vol. 11 Issue 6, p990-994. 5p. |
| Databáze: | Business Source Ultimate |
| Externí odkaz: |
|