Analysis of the Effects of End Connection Quality on the Dielectric Loss of Metallized Film Capacitors.
Autor: | Xiaoguang Qi1, Boggs, Steven2 |
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Zdroj: | IEEE Transactions on Dielectrics & Electrical Insulation. Dec2004, Vol. 11 Issue 6, p990-994. 5p. |
Databáze: | Business Source Ultimate |
Externí odkaz: |