Analysis of temporal carrier build‐up in reconfigurable field‐effect transistor.

Autor: Park, Jeong Woo1, Lee, Seong Hyun1, Kim, Sang Hoon1, Roh, Tae Moon1, Suh, Dongwoo1 dwsuh@etri.re.kr
Zdroj: Electronics Letters (Wiley-Blackwell). Jan2022, Vol. 58 Issue 1, p35-37. 3p.
Databáze: Business Source Ultimate
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