High-Performance In₂O₃-Based 1T1R FET for BEOL Memory Application.

Autor: Lin, Zehao1, Si, Mengwei1, Lyu, Xiao1, Ye, Peide1 yep@purdue.edu
Zdroj: IEEE Transactions on Electron Devices. Aug2021, Vol. 68 Issue 8, p3775-3779. 5p.
Databáze: Business Source Ultimate