Muon-Induced Single-Event Upsets in 20-nm SRAMs: Comparative Characterization With Neutrons and Alpha Particles.
| Autor: | Kato, Takashi1 kato.takashi@socionext.com, Tampo, Motonobu2, Takeshita, Soshi2, Tanaka, Hiroki3, Matsuyama, Hideya1, Hashimoto, Masanori4, Miyake, Yasuhiro2 |
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| Zdroj: | IEEE Transactions on Nuclear Science. Jul2021, Vol. 68 Issue 7, p1436-1444. 9p. |
| Databáze: | Business Source Ultimate |
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