Edge‐guided with gradient‐assisted depth up‐sampling.

Autor: Ren, Yannan1 (AUTHOR), Liu, Ju1 (AUTHOR) juliu@sdu.edu.cn, Yuan, Hui1 (AUTHOR), Wan, Wenbo2 (AUTHOR)
Zdroj: Electronics Letters (Wiley-Blackwell). Oct2017, Vol. 53 Issue 21, p1400-1402. 3p.
Databáze: Business Source Ultimate
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