Comparing Digital and Analog X-ray Inspection for Component Analysis.

Autor: Bernard, David1 d.bernard@dage-group.com, Ainsworth, Steve2 s.ainsworth@dage-group.com
Zdroj: SMT: Surface Mount Technology. Jun2004, Vol. 18 Issue 6, p36-40. 4p. 2 Black and White Photographs, 2 Diagrams, 1 Chart.
Databáze: Business Source Ultimate