Comparing Digital and Analog X-ray Inspection for Component Analysis.
Autor: | Bernard, David1 d.bernard@dage-group.com, Ainsworth, Steve2 s.ainsworth@dage-group.com |
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Zdroj: | SMT: Surface Mount Technology. Jun2004, Vol. 18 Issue 6, p36-40. 4p. 2 Black and White Photographs, 2 Diagrams, 1 Chart. |
Databáze: | Business Source Ultimate |
Externí odkaz: |