| Autor: |
A. Douglass, Dale1 da.douglass@ieee.org, Grant, Ian2 isgrant@tva.gov, Jardini, Jose Antonio3 jose.jardini@gmail.com, Kluge, Robert4 rkluge@atcllc.com, Traynor, Paula5 ptraynor@epri.com, Davis, Cody6 cdavis@generalcable.com, Gentle, Jake7 jake.gentle@inl.gov, Nguyen, Huu-Minh8 minh.nguyen@ampacimon.com, Chisholm, William9 w.a.chisholm@ieee.org, Xu, Charles10 cxu@usi-power.com, Goodwin, Tip11 tip.goodwin.us@ieee.org, Chen, Hong12 hong.chen@pjm.com, Nuthalapati, Sarma13 ndrsarma@ieee.org, Hurst, Neil14 rhurst@edmlink.com |
