Hot-Carrier-Induced Alterations of MOSFET Capacitances: A Quantitative Monitor for Electrical...
| Autor: | Esseni, David, Pieracci, Augusto |
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| Zdroj: | IEEE Transactions on Electron Devices. Nov98, Vol. 45 Issue 11, p2319. 10p. |
| Databáze: | Business Source Ultimate |
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