Electrical Performance and Reliability of Tunnel Magnetoresistance Heads for 100-Gb/in[sup2] Application.
| Autor: | Kuwashima, Tetsuya1 tkuwa@mb1.tdk.co.jp, Fukuda, Kazumasa1, Kiyono, Hiroshi1, Sato, Kazuki1, Kagami, Takeo1, Saruki, Syunji1, Uesugi, Takumi1, Kasahara, Noriaki1, Ohta, Naoki1, Nagai, Kentaro1, Hachisuka, Nozomu1, Takahashi, Norio1, Naoe, Masamu1, Miura, Satoshi1, Barada, Kazuhiro1, Kanaya, Takayasu1, Inage, Kenji1, Kobayashi, Atsuo1 |
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| Zdroj: | IEEE Transactions on Magnetics. Jan2004 Part 2 of 2, Vol. 40 Issue 1, p176-181. 6p. |
| Databáze: | Business Source Ultimate |
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