Effect of Thin Cr and Cu Adhesion Layers on Surface Plasmon Resonance at Au/SiO2 Interfaces.
| Autor: | Chow, Cheng-Ming1, Bain, James A.1 |
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| Zdroj: | IEEE Transactions on Magnetics. Jul2016, Vol. 52 Issue 7, p1-4. 4p. |
| Databáze: | Business Source Ultimate |
| Externí odkaz: |
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