Reliability Assessment of Power MOSFETs Working in Avalanche Mode Based on a Thermal Strain Direct Measurement Approach.
| Autor: | Russo, Sebastiano1, Testa, Antonio2, De Caro, Salvatore2, Scimone, Tommaso2, Panarello, Saverio2, Patane, Salvatore2, Scelba, Giacomo3, Scarcella, Giuseppe3 |
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| Zdroj: | IEEE Transactions on Industry Applications. Mar2016, Vol. 52 Issue 2, p1688-1697. 10p. |
| Databáze: | Business Source Ultimate |
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