Diagnosis of CMOS Op-Amps with gate oxide short faults...

Autor: Yu, S., Jervis, B.W., Eckersall, K. R., Bell, I. M.
Zdroj: IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems. Aug97, Vol. 16 Issue 8, p930. 56p. 1 Diagram, 2 Charts, 2 Graphs.
Databáze: Business Source Ultimate