Diagnosis of CMOS Op-Amps with gate oxide short faults...
Autor: | Yu, S., Jervis, B.W., Eckersall, K. R., Bell, I. M. |
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Zdroj: | IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems. Aug97, Vol. 16 Issue 8, p930. 56p. 1 Diagram, 2 Charts, 2 Graphs. |
Databáze: | Business Source Ultimate |
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