Noninvasive CMOS circuit testing with NbN superconducting single-photon detectors.

Autor:	Zhang, J., Boiadjieva, N., Chulkova, G., Deslandes, H., Gol'tsman, G.N., Korneev, A., Kouminov, P., Leibowitz, M., Lo, W., Malinsky, R., Okunev, O., Pearlman, A., Slysz, W., Smirnov, K., Tsao, C., Verevkin, A., Voronov, B., Wilsher, K., Sobolewski, R.
Zdroj:	Electronics Letters (Institution of Engineering & Technology). 7/10/2003, Vol. 39 Issue 14, p1086-1088. 3p.
Databáze:	Business Source Ultimate
Externí odkaz:	Zobrazit plný text záznamu