Multiple Cell Upset Correction in Memories Using Difference Set Codes.

Autor: Reviriego, P.1, Flanagan, M. F.2, Shih-Fu Liu1, Maestro, J. A.1
Zdroj: IEEE Transactions on Circuits & Systems. Part I: Regular Papers. Nov2012, Vol. 59 Issue 11, p2592-2599. 8p.
Databáze: Business Source Ultimate