NIM-X: A Noise Index Model-Based X-Filling Technique to Overcome the Power Supply Switching Noise Effects on Path Delay Test.
Autor: | Alpaslan, E.1, Kruseman, B.2, Majhi, A. K.2, Heuvalman, W. M.2, Dworak, J.3 |
---|---|
Zdroj: | IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems. May2012, Vol. 31 Issue 5, p809-813. 5p. |
Databáze: | Business Source Ultimate |
Externí odkaz: |