Focused ion beam four-slot milling for Poisson's ratio and residual stress evaluation at the micron scale.

Autor: Sebastiani, M.1 marco.sebastiani@uniroma3.it, Eberl, C.2,3, Bemporad, E.1, Korsunsky, A.M.4, Nix, W.D.5, Carassiti, F.1
Zdroj: Surface & Coatings Technology. Jul2014, Vol. 251, p151-161. 11p.
Databáze: Academic Search Ultimate
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