Characterization of SONOS oxynitride nonvolatile semiconductor memory devices
| Autor: | Wrazien, Stephen J. stw2@lehigh.edu, Zhao, Yijie1, Krayer, Joel D.1, White, Marvin H.1 |
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| Zdroj: | Solid-State Electronics. May2003, Vol. 47 Issue 5, p885. 7p. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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