Effect of exposure and scattering on signal-to-noise ratio for improved defect sensitivity in X-ray radiography.
| Autor: | Saravanan, T, Arunmuthu, K, Philip, John, Rao, B Purna Chandra, Jayakumar, T |
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| Zdroj: | Insight: Non-Destructive Testing & Condition Monitoring. Oct2013, Vol. 55 Issue 10, p548-552. 5p. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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