Strain relaxation of thin Ge films on Si(001) grown by carbon-mediated epitaxy.

Autor: Tetzlaff, D.1 tetzlaff@mbe.uni-hannover.de, Wietler, T.F.1, Bugiel, E.1, Osten, H.J.1
Zdroj: Journal of Crystal Growth. Sep2013, Vol. 378, p254-258. 5p.
Databáze: Academic Search Ultimate