Monitoring multilayer film growth with the atomic force microscope. Aluminum(III)...
Autor: | Kai Hu, Pyati, Radha, Bard, Allen J. |
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Zdroj: | Analytical Chemistry. 07/15/98, Vol. 70 Issue 14, p2870. 6p. 5 Diagrams, 1 Chart, 3 Graphs. |
Databáze: | Academic Search Ultimate |
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