Monitoring multilayer film growth with the atomic force microscope. Aluminum(III)...

Autor: Kai Hu, Pyati, Radha, Bard, Allen J.
Zdroj: Analytical Chemistry. 07/15/98, Vol. 70 Issue 14, p2870. 6p. 5 Diagrams, 1 Chart, 3 Graphs.
Databáze: Academic Search Ultimate