Correlation between density and structure. in boron nitride thin films by X-ray diffraction.
| Autor: | Donner, W., Chamera, S., Rühm, A., Dosch, H., Ulrich, S., Ehrhardt, H. |
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| Zdroj: | Applied Physics A: Materials Science & Processing. 1997, Vol. 65 Issue 1, p1. 4p. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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