Application of resonant X-ray emissions for molecular/electronic structure analysis of boron nitrides.
| Autor: | Muramatsu, Y., Kouzuki, H., Kaneyoshi, T., Motoyama, M., Agui, A., Shin, S., Kato, H., Kawai, J. |
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| Zdroj: | Applied Physics A: Materials Science & Processing. 1997, Vol. 65 Issue 2, p191. 4p. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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