Hard X-ray photoelectron spectroscopy on buried, off-stoichiometric CoMnGe ( x: z=2:0.38) Heusler thin films.
| Autor: | Ouardi, Siham1 ouardis@uni-mainz.de, Fecher, Gerhard1 fecher@cpfs.mpg.de, Chadov, Stanislav1, Balke, Benjamin2, Kozina, Xenia2, Felser, Claudia1, Taira, Tomoyuki3, Yamamoto, Masafumi3 |
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| Zdroj: | Applied Physics A: Materials Science & Processing. May2013, Vol. 111 Issue 2, p395-405. 11p. 1 Diagram, 1 Chart, 11 Graphs. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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