Structure of Porous Surface Layers of Single-Crystal GaAs(001) Wafers from Data of X-ray Diffractometry and Reflectometry.
| Autor: | Lomov, A. A., Karavanskiı, V. A., Imamov, R. M., Sutyrin, A. G., Dravin, V. A. |
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| Zdroj: | Crystallography Reports. Nov2002, Vol. 47 Issue 6, p1051. 7p. |
| Databáze: | Academic Search Ultimate |
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