Piezoresponse force microscopy characterization of rare-earth doped BiFeO3 thin films grown by the soft chemical method
| Autor: | Foschini, C.R.1, Ramirez, M.A.2, Simões, S.R.2, Varela, J.A.1, Longo, E.1, Simões, A.Z.2 alezipo@yahoo.com |
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| Zdroj: | Ceramics International. Apr2013, Vol. 39 Issue 3, p2185-2195. 11p. |
| Databáze: | Academic Search Ultimate |
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