ISTFA 2012 User's Group--Focused Ion Beam (FIB).
| Autor: | DiBattista, Michael1 mdibatti@qti.qualcomm.com, Livengood, Richard2 richard.h.livengood@intel.com |
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| Zdroj: | Electronic Device Failure Analysis. Feb2013, Vol. 15 Issue 1, p38-39. 2p. |
| Databáze: | Academic Search Ultimate |
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