Near-field microwave microscopy of nanometer-scale metal layers on dielectric substrates.

Autor: Usanov, D.1 UsanovDA@sgu.ru, Skripal', A.1, Abramov, A.1, Bogolyubov, A.1, Korotin, B.1, Feklistov, V.1, Ponomarev, D.1, Frolov, A.1
Zdroj: Semiconductors. Dec2012, Vol. 46 Issue 13, p1622-1626. 5p.
Databáze: Academic Search Ultimate