Contamination Cleaning of TEM/SEM Samples with the ZONE Cleaner.
Autor: | Soong, Charles1, Woo, Patrick1, Hoyle, David1 |
---|---|
Zdroj: | Microscopy Today. Nov2012, Vol. 20 Issue 6, p44-48. 5p. |
Databáze: | Academic Search Ultimate |
Externí odkaz: |
Autor: | Soong, Charles1, Woo, Patrick1, Hoyle, David1 |
---|---|
Zdroj: | Microscopy Today. Nov2012, Vol. 20 Issue 6, p44-48. 5p. |
Databáze: | Academic Search Ultimate |
Externí odkaz: |