Direct measurement of the complex refractive index of thin foils in the XUV spectral range by point diffraction interferometry.
| Autor: | Hemmers, D.1 dirk.hemmers@uni-duesseldorf.de, Benzid, M.1, Pretzler, G.1 |
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| Zdroj: | Applied Physics B: Lasers & Optics. Jul2012, Vol. 108 Issue 1, p167-175. 9p. 4 Diagrams, 3 Graphs. |
| Databáze: | Academic Search Ultimate |
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