Investigation of the crystallization process and crystal structure of Si-incorporated GeSb phase-change films.

Autor: Kim, Hyung1, Kim, Nam1, Choi, Doo1 drchoidj@yonsei.ac.kr
Zdroj: Journal of Materials Science. Sep2012, Vol. 47 Issue 18, p6679-6687. 9p.
Databáze: Academic Search Ultimate