Investigation of the crystallization process and crystal structure of Si-incorporated GeSb phase-change films.
Autor: | Kim, Hyung1, Kim, Nam1, Choi, Doo1 drchoidj@yonsei.ac.kr |
---|---|
Zdroj: | Journal of Materials Science. Sep2012, Vol. 47 Issue 18, p6679-6687. 9p. |
Databáze: | Academic Search Ultimate |
Externí odkaz: |