Transient electro-thermal characterization of Si–Ge heterojunction bipolar transistors
Autor: | Sahoo, Amit Kumar amit-kumar.sahoo@ims-bordeaux.fr, Weiß, Mario1, Fregonese, Sébastien1, Malbert, Nathalie1, Zimmer, Thomas1 |
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Zdroj: | Solid-State Electronics. Aug2012, Vol. 74, p77-84. 8p. |
Databáze: | Academic Search Ultimate |
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