Techniques to minimize DX center deleterious effects in III-V device performance.

Autor: Muñoz, E., Calleja, E., Izpura, I., García, F., Romero, A. L., Sánchez-Rojas, J. L., Powell, A. L., Castagné, J.
Zdroj: Journal of Applied Physics. 5/15/1993, Vol. 73 Issue 10, p4988. 10p.
Databáze: Academic Search Ultimate