Mapping of GaAs wafers by quantitative infrared microscopy.
Autor: | Dobrilla, P., Blakemore, J. S. |
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Zdroj: | Journal of Applied Physics. 2/15/1987, Vol. 61 Issue 4, p1442. 7p. 6 Black and White Photographs, 1 Diagram. |
Databáze: | Academic Search Ultimate |
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