A Comparative Study of the Atomic Hydrogen Penetration into Thin Vanadium Films and Silicon Oxide–Gallium Arsenide Structures.
| Autor: | Bozhkov, V. G., Kagadeı, V. A., Proskurovskiı, D. I., Romas’, L. M. |
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| Zdroj: | Technical Physics Letters. Oct2000, Vol. 26 Issue 10, p926. 3p. |
| Databáze: | Academic Search Ultimate |
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