Method of the Ratio of Envelopes of the Reflection Spectrum for Measuring Optical Constants and Thickness of Thin Films.
| Autor: | Filippov, V. V. |
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| Zdroj: | Optics & Spectroscopy. Apr2000, Vol. 88 Issue 4, p581. 5p. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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