Study of submicron deposits in polycrystalline materials using the internal-friction method.
| Autor: | Andreev, Yu. N., Yaroslavtsev, N. P., Bestaev, M. V., Dimitrov, D. Ts., Moshnikov, V. A., Tairov, Yu. M. |
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| Zdroj: | Semiconductors. Jul97, Vol. 31 Issue 7, p714. 2p. |
| Databáze: | Academic Search Ultimate |
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