X-ray diffraction, neutron scattering and EXAFS spectroscopy of monoclinic zirconia: analysis by Rietveld refinement and reverse Monte Carlo simulations.
| Autor: | Winterer, Markus, Delaplane, Robert, McGreevy, Robert |
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| Zdroj: | Journal of Applied Crystallography. Aug2002, Vol. 35 Issue 4, p434. 9p. |
| Databáze: | Academic Search Ultimate |
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