Effect of the structure of polarimeter characteristic matrix on light polarization measurements.

Autor: Savenkov, S. N.1 sns@univ.kiev.ua, Oberemok, Ye. A.1, Klimov, O. S.1, Barchuk, O. I.1
Zdroj: Semiconductor Physics, Quantum Electronics & Optoelectronics. 2009, Vol. 12 Issue 3, p264-271. 8p.
Databáze: Academic Search Ultimate