Evaluation of coated and uncoated CaF2 optics by variable angle spectroscopic ellipsometry

Autor: Wang, Jue wangj3@corning.com, VanKerkhove, Steven, Schreiber, Horst
Zdroj: Thin Solid Films. Feb2011, Vol. 519 Issue 9, p2881-2884. 4p.
Databáze: Academic Search Ultimate
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