Electrical and Optical Characterization of PECVD Silicon Carbon Nitride Thin Films.

Autor: Huran, Jozef1 elekhura@savba.sk, Shindov, Peter Hristov2, Smatko, Vasil3 eleksmat@savba.sk, Valovic, Albin1 albin.valovic@savba.sk, Kobzev, Alexander P.4 kobzev@nf.jinr.ru
Zdroj: Annual Journal of Electronics. 2010, Vol. 4 Issue 1, p94-96. 3p.
Databáze: Academic Search Ultimate