Challenges and Opportunities for Focused Ion Beam Processing at the Nano-Scale.
| Autor: | Gierak, J.1, Schiedt, B.1, Lucot, D.1, Madouri, A.1, Bourhis, E.1, Patriarche, G.1, Ulysse, C.1, Lafosse, X.1, Auvray, L.2, Bruchhaus, L.3, Jede, R.3 |
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| Zdroj: | Microscopy Today. 2009, Vol. 17 Issue 5, p14-17. 4p. |
| Databáze: | Academic Search Ultimate |
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