Determination of optical properties and thickness of nanolayers from the angular dependences of reflectance.
| Autor: | Bilenko, D. I.1 bil@sgu.ru, Sagaidachnyi, A. A.1, Galushka, V. V.1, Polyanskaya, V. P.1 |
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| Zdroj: | Technical Physics. Oct2010, Vol. 55 Issue 10, p1478-1483. 6p. 1 Diagram, 3 Charts, 3 Graphs. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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