Evidence of Dot-size Variation in Nanowire Silicon Transistor.
| Autor: | Yue-Min Wan1 ymwan@isu.edu.tw, Kuo-Dong Huang2,3 kdhuang@nsysu.edu.tw, Shu-Fen Hu4,5 sfhu@ndl.gov.tw, Chin Lung Sun4 clsun@ndl.gov.tw |
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| Zdroj: | World Congress on Engineering 2009 (Volume 1). 2009, p397-399. 3p. 2 Diagrams, 3 Graphs. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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