A technique for characterizing surface recombination in silicon wafers based on thermal-emission measurements.
| Autor: | Bogatyrenko, V. V.1 bogatyrenko@isp.kiev.ua |
|---|---|
| Zdroj: | Semiconductors. Mar2010, Vol. 44 Issue 3, p392-395. 4p. 1 Diagram, 2 Graphs. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
|