Effect of thermal oxidation on charge carrier transport in nanostructured silicon.
| Autor: | Agafonova, E. A.1, Martyshov, M. N.1, Forsh, P. A.1,2 forsh@vega.phys.msu.ru, Timoshenko, V. Yu.1,2, Kashkarov, P. K.1,2 |
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| Zdroj: | Semiconductors. Mar2010, Vol. 44 Issue 3, p350-353. 4p. 5 Graphs. |
| Databáze: | Academic Search Ultimate |
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